| 9:00-9:30 |
Welcome/Overview (Goals of meeting)
(G0-04-024,
.pdf )
|
Beck |
| 9:30-10:30 |
| Back angle I (Turnaround Scenario) (Topics: magnet turnaround, FW turnaround,
target modifications) |
Roos |
| |
Target Modifications
(G0-04-010,
.pdf )
|
Gaskell |
| |
Target Load-Lock
(G0-04-011,
.pdf )
|
Williamson |
|
| 11:00-12:00 |
Analysis I
(G0-04-012,
.pdf )
|
Roche/King |
| |
Beam Quality and Linear Regression
(G0-04-012,
.pdf )
|
Nakahara |
|
| 1:30-3:00 |
| Back Angle II (Assembly/testing new equipment)
(Topics: Support structure, CEDs, Cerenkov, Electronics)
|
Lee/Rutledge |
| |
CEDs and Cerenkovs
(G0-04-037,
.pdf ,
.ppt.gz )
|
Lee |
| |
French CED Electronics
(G0-04-014,
.pdf )
|
Wells |
| |
North American CED Electronics
(G0-04-015,
.pdf )
|
Wells |
|
| 3:30-5:00 |
| Analysis II (detailed presentations) |
Roche/King |
| |
North American (NA) Electronics Analysis at CMU
(G0-04-016,
.pdf ,
.ps.gz )
|
Quinn |
| |
Grenoble Analysis
(G0-04-017,
.pdf )
|
Guillon |
| |
Inelastic Backgrounds
(G0-04-018,
.pdf )
|
Liu |
| |
Leakage Current Correction
(G0-04-019,
.pdf )
|
Liu |
| |
GEANT Simulation Update
(G0-04-020,
.pdf )
|
Hannelius |
|